Initialization of the BIMBO self-test method using binary inputs and outputs

Jérôme Juillard (1) , Eric Colinet (2)

1 SUPELEC-Campus Gif
2 CEA

This paper deals with the initialization of the BIMBO method, a deterministic identification method based on binary observation, for the (self-) test of integrated electronic and electromechanical systems, such as MEMS. Finding an adequate starting point for the parameter estimation algorithm may be crucial, depending on the chosen model parameterization. We show how this starting point may be obtained using only binary inputs and outputs and a few straightforward calculations. The practical implementation of this method only requires a one-bit digital-to-analog converter (DAC) and a one-bit analog-to-digital converter (ADC). This makes the proposed approach very amenable to integration and leads to no additional cost compared to the BIMBO method. We describe the method from a theoretical point of view, discuss its implementation and illustrate it in some idealized cases.

Keywords: integrated electronics; Parameter estimation; self-test; binary data processing; microsystems; integrated electronics.

Domains: Engineering Sciences [physics]; Automatic; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics; Engineering Sciences [physics]; Signal and Image processing; Mathematics [math]; Probability [math.PR]; Computer Science [cs]; Signal and Image Processing

Jérôme Juillard, Eric Colinet. Initialization of the BIMBO self-test method using binary inputs and outputs. 46th IEEE CDC 2007, Dec 2007, New Orleans, United States. pp.578-583, ⟨10.1109/CDC.2007.4434031⟩. ⟨hal-00214257⟩