Comparison of buried and implanted tunnel junction as current confinement schemes for the realisation of single transverse mode large diameter (50µm) 1.55µm InP-based electrically-pumped VECSELs
Abstract
We compared buried (BTJ) and ion implanted tunnel junction (ITJ) as current confinement schemes for 1550nm ½-VCSELs. Reduced thermal resistance is obtained for BJT, but reduced current crowding is evidenced for ITJ. Singletransverse mode laser emission is obtained from large diameters devices.