Metrology in the perspective of a survey of the exposure of a representative sample of the French population to Extremely Low Frequency magnetic fields

Alain Azoulay; J. Lambrozo; Thierry Letertre

Conference Papers Year : 2007

Metrology in the perspective of a survey of the exposure of a representative sample of the French population to Extremely Low Frequency magnetic fields

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Alain Azoulay

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J. Lambrozo

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Thierry Letertre

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Submitted on : Friday, May 9, 2008-4:09:03 PM

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hal-00278230 , version 1 (09-05-2008)

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Alain Azoulay, J. Lambrozo, Thierry Letertre. Metrology in the perspective of a survey of the exposure of a representative sample of the French population to Extremely Low Frequency magnetic fields. Eilat Electricity 2007, Nov 2007, Eilat, Israel. pp.CD-ROM Proceedings. ⟨hal-00278230⟩

Metrology in the perspective of a survey of the exposure of a representative sample of the French population to Extremely Low Frequency magnetic fields

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