Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

F. Renard; A. Vande Wouwer; S. Valentinotti; Didier Dumur

Journal Articles Journal of Process Control Year : 2006

Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

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F. Renard

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A. Vande Wouwer

Function : Author

S. Valentinotti

Function : Author

Didier Dumur

Function : Author
PersonId : 16083
IdHAL : didier-dumur
ORCID : 0000-0002-0474-5080
IdRef : 034782001

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00279668

Submitted on : Thursday, May 15, 2008-9:31:27 AM

Last modification on : Tuesday, February 14, 2023-3:37:50 AM

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hal-00279668 , version 1 (15-05-2008)

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HAL Id : hal-00279668 , version 1

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F. Renard, A. Vande Wouwer, S. Valentinotti, Didier Dumur. Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information. Journal of Process Control, 2006, pp.1-10. ⟨hal-00279668⟩

Control of Yeast Fed-Batch Cultures using Minimal a priori Process Knowledge and Measurement Information

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