Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy - Archive ouverte HAL

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Journal Articles Applied Physics Letters Year : 2007

Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy

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1

Olivier Schneegans

Function : Author
PersonId : 15895
IdHAL : olivier-schneegans
ORCID : 0000-0001-9741-3327
IdRef : 18007007X

Laboratoire de génie électrique de Paris

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

Pascal Chrétien

Function : Author
PersonId : 5981
IdHAL : pascal-chretien

Laboratoire de génie électrique de Paris

René Meyer

Function : Author

Laboratoire de génie électrique de Paris

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00320357

Submitted on : Wednesday, September 10, 2008-5:26:49 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00320357 , version 1 (10-09-2008)

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HAL Id : hal-00320357 , version 1

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Olivier Schneegans, Frédéric Houzé, Pascal Chrétien, René Meyer. Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy. Applied Physics Letters, 2007, 90, pp.043116. ⟨hal-00320357⟩

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