Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements - Archive ouverte HAL Access content directly
Journal Articles Journal of Non-Crystalline Solids Year : 2004

Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements

F.T. Reis
  • Function : Author
Denis Mencaraglia
Laboratoire de génie électrique de Paris
CV
Sidi Ould Saad
Laboratoire de génie électrique de Paris
CV
Isabelle Séguy
M. Oukachmih
  • Function : Author
Pascale Jolinat
  • Function : Author
P. Destruel
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00320881

Submitted on : Thursday, September 11, 2008-6:04:02 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00320881 , version 1 (11-09-2008)

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  • HAL Id : hal-00320881 , version 1

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F.T. Reis, Denis Mencaraglia, Sidi Ould Saad, Isabelle Séguy, M. Oukachmih, et al.. Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements. Journal of Non-Crystalline Solids, 2004, 338-340, pp.599-602. ⟨hal-00320881⟩

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