New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions - Archive ouverte HAL Access content directly
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New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

Alexander Gudovskikh
  • Function : Author
Laboratoire de génie électrique de Paris
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
R. Stangl
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00321574

Submitted on : Monday, September 15, 2008-12:39:12 PM

Last modification on : Tuesday, February 14, 2023-3:38:22 AM

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hal-00321574 , version 1 (15-09-2008)

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  • HAL Id : hal-00321574 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider, R. Stangl. New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions. 21st International Conference on Amorphous and Nanocrystalline Semiconductors, 2005, Portugal. ⟨hal-00321574⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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