Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy - CentraleSupélec

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

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1

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

José Alvarez

Function : Author
PersonId : 5252
IdHAL : jose-alvarez
ORCID : 0000-0003-3558-8302
IdRef : 089018222

Laboratoire de génie électrique de Paris

Jean-Paul Kleider

Function : Author
PersonId : 5984
IdHAL : jean-paul-kleider
ORCID : 0000-0003-4388-6326
IdRef : 03273039X

Laboratoire de génie électrique de Paris

P. Bergonzo

Function : Author
PersonId : 740510
IdHAL : philippe-bergonzo
ORCID : 0000-0002-0647-9134
IdRef : 122049462

E. Snidero

Function : Author

D. Tromson

Function : Author

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00321705

Submitted on : Monday, September 15, 2008-4:50:54 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00321705 , version 1 (15-09-2008)

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HAL Id : hal-00321705 , version 1

Cite

Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond 2005, 2005, France. ⟨hal-00321705⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE

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