New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions - Archive ouverte HAL Access content directly
Journal Articles Journal of Non-Crystalline Solids Year : 2006

New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions

Alexander Gudovskikh
  • Function : Author
Laboratoire de génie électrique de Paris
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
R. Stangl
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00321743

Submitted on : Monday, September 15, 2008-5:45:18 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00321743 , version 1 (15-09-2008)

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  • HAL Id : hal-00321743 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider, R. Stangl. New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions. Journal of Non-Crystalline Solids, 2006, 352, pp.1213-1216. ⟨hal-00321743⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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