Crystallographic and electrical characterization of tungsten carbide thin films for Schottky contact of diamond photodiode - Archive ouverte HAL Access content directly
Journal Articles Journal of Vacuum Science and Technology Year : 2006

Crystallographic and electrical characterization of tungsten carbide thin films for Schottky contact of diamond photodiode

M. Liao
  • Function : Author
Y. Koide
  • Function : Author
José Alvarez
Laboratoire de génie électrique de Paris
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https://hal-centralesupelec.archives-ouvertes.fr/hal-00321748

Submitted on : Monday, September 15, 2008-5:56:30 PM

Last modification on : Tuesday, February 14, 2023-3:36:59 AM

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hal-00321748 , version 1 (15-09-2008)

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  • HAL Id : hal-00321748 , version 1

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M. Liao, Y. Koide, José Alvarez. Crystallographic and electrical characterization of tungsten carbide thin films for Schottky contact of diamond photodiode. Journal of Vacuum Science and Technology, 2006, 24, pp.185-189. ⟨hal-00321748⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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