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Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy

José Alvarez
Laboratoire de génie électrique de Paris
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https://hal-centralesupelec.archives-ouvertes.fr/hal-00321893

Submitted on : Tuesday, September 16, 2008-10:35:03 AM

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hal-00321893 , version 1 (16-09-2008)

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  • HAL Id : hal-00321893 , version 1

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José Alvarez. Local electrical and photoelectrical characterizations of diamond electronic devices by conducting probe atomic force microscopy. National Institute of Materials Science, 2006, Japan. ⟨hal-00321893⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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