Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits - CentraleSupélec Access content directly
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Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits

J. Damon-Lacoste
  • Function : Author
Pere Roca I Cabarrocas
Y. Veschetti
  • Function : Author
P.J. Ribeyron
  • Function : Author
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Dates and versions

hal-00321915 , version 1 (16-09-2008)

Identifiers

  • HAL Id : hal-00321915 , version 1

Cite

Alexander Gudovskikh, Samah Ibrahim, Jean-Paul Kleider, J. Damon-Lacoste, Pere Roca I Cabarrocas, et al.. Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits. E-MRS 2006 Spring Meeting, 2006, France. ⟨hal-00321915⟩
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