Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits - Archive ouverte HAL Access content directly
Journal Articles Thin Solid Films Year : 2007

Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits

A.S. Gudovskikh
  • Function : Author
Samah Ibrahim
  • Function : Author
Laboratoire de génie électrique de Paris
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
J. Damon-Lacoste
  • Function : Author
Pere Roca I Cabarrocas
Y. Veschetti
  • Function : Author
P.J. Ribeyron
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00322077

Submitted on : Tuesday, September 16, 2008-3:51:18 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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hal-00322077 , version 1 (16-09-2008)

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  • HAL Id : hal-00322077 , version 1

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A.S. Gudovskikh, Samah Ibrahim, Jean-Paul Kleider, J. Damon-Lacoste, Pere Roca I Cabarrocas, et al.. Determination of band offsets in a-Si:H/c-Si heterojunctions from capacitance-voltage measurements: capabilities and limits. Thin Solid Films, 2007, 515, pp.7481-7485. ⟨hal-00322077⟩

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