New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements

A.S. Gudovskikh; V. Lantratov; Rémy Chouffot; Jean-Paul Kleider; J. Damon-Lacoste; D. Eon; Pere Roca I Cabarrocas; P.J. Ribeyron

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New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements

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1

A.S. Gudovskikh

Function : Author

V. Lantratov

Function : Author

Rémy Chouffot

Function : Author

Laboratoire de génie électrique de Paris

Jean-Paul Kleider

Function : Author
PersonId : 5984
IdHAL : jean-paul-kleider
ORCID : 0000-0003-4388-6326
IdRef : 03273039X

Laboratoire de génie électrique de Paris

CV

J. Damon-Lacoste

Function : Author

D. Eon

Function : Author

Pere Roca I Cabarrocas

Function : Author
PersonId : 760063
ORCID : 0000-0003-2241-2762
IdRef : 034125663

P.J. Ribeyron

Function : Author

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00322267

Submitted on : Wednesday, September 17, 2008-10:35:55 AM

Last modification on : Tuesday, February 14, 2023-3:35:49 AM

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hal-00322267 , version 1 (17-09-2008)

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HAL Id : hal-00322267 , version 1

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A.S. Gudovskikh, V. Lantratov, Rémy Chouffot, Jean-Paul Kleider, J. Damon-Lacoste, et al.. New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements. E-MRS 2007 Spring Meeting, 2007, France. ⟨hal-00322267⟩

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New method for interface characterisation in heterojunction solar cells based on diffusion capacitance measurements

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