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Journal Articles Thin Solid Films Year : 2008

New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements

A.S. Gudovskikh
  • Function : Author
Rémy Chouffot
  • Function : Author
Laboratoire de génie électrique de Paris
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
N.A. Kaluzhniy
  • Function : Author
V. Lantratov
  • Function : Author
S.A. Mintairov
  • Function : Author
J. Damon-Lacoste
  • Function : Author
D. Eon
  • Function : Author
Pere Roca I Cabarrocas
P.J. Ribeyron
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00350881

Submitted on : Wednesday, January 7, 2009-5:03:43 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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hal-00350881 , version 1 (07-01-2009)

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  • HAL Id : hal-00350881 , version 1

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A.S. Gudovskikh, Rémy Chouffot, Jean-Paul Kleider, N.A. Kaluzhniy, V. Lantratov, et al.. New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements. Thin Solid Films, 2008, 516, pp.6786. ⟨hal-00350881⟩

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