Characterization of amorphous/crystalline silicon interfaces from electrical measurements - Archive ouverte HAL Access content directly
Conference Papers Year :

Characterization of amorphous/crystalline silicon interfaces from electrical measurements

Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
A.S. Gudovskikh
  • Function : Author

Olivier Schneegans  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00351211

Submitted on : Thursday, January 8, 2009-4:30:52 PM

Last modification on : Tuesday, February 14, 2023-3:38:32 AM

Not file

Dates and versions

hal-00351211 , version 1 (08-01-2009)

Identifiers

  • HAL Id : hal-00351211 , version 1

Cite

Jean-Paul Kleider, A.S. Gudovskikh. Characterization of amorphous/crystalline silicon interfaces from electrical measurements. MRS Spring Meeting, Mar 2008, San Francisco, United States. ⟨hal-00351211⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
41 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More