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Conference Papers Year : 2008

Characterization of amorphous/crystalline silicon interfaces from electrical measurements

Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
A.S. Gudovskikh
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https://hal-centralesupelec.archives-ouvertes.fr/hal-00351223

Submitted on : Thursday, January 8, 2009-4:48:00 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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hal-00351223 , version 1 (08-01-2009)

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  • HAL Id : hal-00351223 , version 1

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Jean-Paul Kleider, A.S. Gudovskikh. Characterization of amorphous/crystalline silicon interfaces from electrical measurements. MRS Spring Meeting, Mar 2008, San Francisco, United States. ⟨hal-00351223⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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