Electrical contact reliability in a magnetic MEMS switch

M. Vincent; L. Chiesi; J.-C. Fourrier; Aline Garnier; B. Grappe; C. Lapiere; C. Coutier; A. Sampiero; S. Paineau; Frédéric Houzé; Sophie Noël

Conference Papers Year : 2008

Electrical contact reliability in a magnetic MEMS switch

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1

M. Vincent

Function : Author

L. Chiesi

Function : Author

J.-C. Fourrier

Function : Author

Aline Garnier

Function : Author

B. Grappe

Function : Author

C. Lapiere

Function : Author

C. Coutier

Function : Author

A. Sampiero

Function : Author

S. Paineau

Function : Author

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

CV

Sophie Noël

Function : Author
PersonId : 17556
IdHAL : sophie-noel
IdRef : 081093446

Laboratoire de génie électrique de Paris

CV

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00351428

Submitted on : Friday, January 9, 2009-11:33:08 AM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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hal-00351428 , version 1 (09-01-2009)

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HAL Id : hal-00351428 , version 1

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M. Vincent, L. Chiesi, J.-C. Fourrier, Aline Garnier, B. Grappe, et al.. Electrical contact reliability in a magnetic MEMS switch. 54th Holm Conference on Electrical Contacts, Oct 2008, Orlando, United States. pp.145. ⟨hal-00351428⟩

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Electrical contact reliability in a magnetic MEMS switch

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