Non destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat; P.-Y. Joubert; Yann Le Bihan; Claude Marchand

Conference Papers Year : 2008

Non destructive evaluation of small defects using an eddy current microcoil sensor array

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1

Cyril Ravat

Function : Author

Laboratoire de génie électrique de Paris

P.-Y. Joubert

Function : Author

Yann Le Bihan

Function : Author
PersonId : 6436
IdHAL : yann-le-bihan
ORCID : 0000-0001-5563-9192
IdRef : 095667075

Laboratoire de génie électrique de Paris

CV

Claude Marchand

Function : Author
PersonId : 4650
IdHAL : claude-marchand
IdRef : 076292274

Laboratoire de génie électrique de Paris

CV

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Submitted on : Wednesday, January 14, 2009-4:02:15 PM

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hal-00353081 , version 1 (14-01-2009)

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Cyril Ravat, P.-Y. Joubert, Yann Le Bihan, Claude Marchand. Non destructive evaluation of small defects using an eddy current microcoil sensor array. EMSA 2008 Conference, Jul 2008, Caen, France. ⟨hal-00353081⟩

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Non destructive evaluation of small defects using an eddy current microcoil sensor array

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