Admittance Spectroscopy analysis of electronic properties in electrodeposited CISEL absorbers and influence of thermal treatment - CentraleSupélec Access content directly
Conference Papers Year : 2008

Admittance Spectroscopy analysis of electronic properties in electrodeposited CISEL absorbers and influence of thermal treatment

C.M. Ruiz
E. Saucedo
  • Function : Author
V. Bermudez
  • Function : Author
Arouna Darga
Laboratoire de génie électrique de Paris
CV
Denis Mencaraglia
Laboratoire de génie électrique de Paris
CV

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00354222

Submitted on : Monday, January 19, 2009-12:06:36 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

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hal-00354222 , version 1 (19-01-2009)

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  • HAL Id : hal-00354222 , version 1

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C.M. Ruiz, E. Saucedo, V. Bermudez, Arouna Darga, Denis Mencaraglia. Admittance Spectroscopy analysis of electronic properties in electrodeposited CISEL absorbers and influence of thermal treatment. 23rd European Photovoltaic Solar Energy Conference and Exhibition, Sep 2008, Valencia, Spain. ⟨hal-00354222⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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