Journal Articles
Studies in Applied Electromagnetics and Mechanics
Year : 2008
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https://hal-centralesupelec.archives-ouvertes.fr/hal-00354401
Submitted on : Monday, January 19, 2009-5:11:27 PM
Last modification on : Friday, March 24, 2023-2:52:51 PM
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- HAL Id : hal-00354401 , version 1
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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects. Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293. ⟨hal-00354401⟩
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