Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

Matthieu Bardoux (1) , Adel Bousseksou (2) , Gilles Tessier (1) , Sophie Bouchoule (2) , Danièle Fournier (1) , Abdelmajid Salhi (3) , Yves Rouillard (3, 4) , Frédéric Genty (5)

1 Laboratoire Photons Et Matière
2 LPN - Laboratoire de photonique et de nanostructures
3 IES - Institut d’Electronique et des Systèmes
4 RADIAC - Radiations et composants
5 LMOPS - Laboratoire Matériaux Optiques, Photonique et Systèmes

Thermal characterization of semiconductor lasers is an important issue for optoelectronics. This paper presents our thermoreflectance measurements on two different types of laser diodes : classical ridge laser diodes and vertical cavity surface emitting lasers(VCSELs). We first studied the external temperature increase in ridge diodes in order to determine inhomogeneity. Then,we tried to determine the inner temperature of the VCSELs.

Domains: Physics [physics]; Physics [physics]; Optics [physics.optics]

Matthieu Bardoux, Adel Bousseksou, Gilles Tessier, Sophie Bouchoule, Danièle Fournier, et al.. Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction. Optics and Lasers in Engineering, 2009, 47 (3-4), pp.473-476. ⟨10.1016/j.optlaseng.2008.07.011⟩. ⟨hal-00380616⟩