An original apparatus for endurance testing of MEMS electrical contact materials

M. Vincent; L. Chiesi; P. Rousset; C. Lapierre; C. Poulain; L. Carbone; Frédéric Houzé; J. Delamarre

Conference Papers Year : 2009

An original apparatus for endurance testing of MEMS electrical contact materials

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1

M. Vincent

Function : Author

L. Chiesi

Function : Author

P. Rousset

Function : Author

C. Lapierre

Function : Author

C. Poulain

Function : Author

L. Carbone

Function : Author

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

CV

J. Delamarre

Function : Author

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00445399

Submitted on : Friday, January 8, 2010-12:45:43 PM

Last modification on : Tuesday, February 14, 2023-3:35:58 AM

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hal-00445399 , version 1 (08-01-2010)

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M. Vincent, L. Chiesi, P. Rousset, C. Lapierre, C. Poulain, et al.. An original apparatus for endurance testing of MEMS electrical contact materials. 55th Holm Conference on Electrical Contacts, Sep 2009, Vancouver, Canada. pp. 285-289. ⟨hal-00445399⟩

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An original apparatus for endurance testing of MEMS electrical contact materials

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