Support Vector Machines for Measuring Dielectric Properties of Materials - Archive ouverte HAL Access content directly
Conference Papers Year : 2009

Support Vector Machines for Measuring Dielectric Properties of Materials

Not file

Dates and versions

hal-00446791 , version 1 (13-01-2010)

Identifiers

  • HAL Id : hal-00446791 , version 1

Cite

Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, Lionel Pichon. Support Vector Machines for Measuring Dielectric Properties of Materials. ISEF 2009 - XIV International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering, Sep 2009, Arras, France. pp.CD-Rom Proceedings. ⟨hal-00446791⟩
110 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More