Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing - CentraleSupélec

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Journal Articles Sensor letters Year : 2009

Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

(1) , (1) , (1) , (1)

1

Yahya Choua

Function : Author

Laboratoire de génie électrique de Paris

Laurent Santandréa

Function : Author
PersonId : 9353
IdHAL : laurent-santandrea
IdRef : 253136555

Laboratoire de génie électrique de Paris

Yann Le Bihan

Function : Author
PersonId : 6436
IdHAL : yann-le-bihan
ORCID : 0000-0001-5563-9192
IdRef : 095667075

Laboratoire de génie électrique de Paris

Claude Marchand

Function : Author
PersonId : 4650
IdHAL : claude-marchand
IdRef : 076292274

Laboratoire de génie électrique de Paris

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00447220

Submitted on : Thursday, January 14, 2010-3:39:40 PM

Last modification on : Friday, March 24, 2023-2:52:52 PM

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hal-00447220 , version 1 (14-01-2010)

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HAL Id : hal-00447220 , version 1

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Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing. Sensor letters, 2009, 7 (5), pp. 475-479. ⟨hal-00447220⟩

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