Mesh Refinement in Eddy Current Testing with Separated T-R probes - Archive ouverte HAL

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Conference Papers Year : 2009

Mesh Refinement in Eddy Current Testing with Separated T-R probes

(1) , (1) , (1) , (1)

1

Yahya Choua

Function : Author

Laboratoire de génie électrique de Paris

Laurent Santandréa

Function : Author
PersonId : 9353
IdHAL : laurent-santandrea
IdRef : 253136555

Laboratoire de génie électrique de Paris

Yann Le Bihan

Function : Author
PersonId : 6436
IdHAL : yann-le-bihan
ORCID : 0000-0001-5563-9192
IdRef : 095667075

Laboratoire de génie électrique de Paris

Claude Marchand

Function : Author
PersonId : 4650
IdHAL : claude-marchand
IdRef : 076292274

Laboratoire de génie électrique de Paris

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00447250

Submitted on : Thursday, January 14, 2010-3:46:39 PM

Last modification on : Tuesday, February 14, 2023-3:38:20 AM

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hal-00447250 , version 1 (14-01-2010)

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HAL Id : hal-00447250 , version 1

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Yahya Choua, Laurent Santandréa, Yann Le Bihan, Claude Marchand. Mesh Refinement in Eddy Current Testing with Separated T-R probes. COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049. ⟨hal-00447250⟩

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