A new digital modulation recognition technique using the phase detector reliability
Abstract
A new feature based digital modulation identification algorithm has been developed and presented in this paper. The algorithm developed uses the reliability of a decision-directed (DD) phase detector as a modulation scheme classification feature. Unlike feature based methods found in literature, the classification decision of the proposed algorithm does not rely on decision thresholds. Simulation results covering 64-QAM, 16-QAM, 16-APSK and 8-PSK modulation schemes show promising identification statistics with high probability of correct classification in the presence of noise even with high order modulation schemes.