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Conference Papers Year : 2010

Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors

Jean-Paul Kleider
Laboratoire de génie électrique de Paris
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https://hal-centralesupelec.archives-ouvertes.fr/hal-00555256

Submitted on : Wednesday, January 12, 2011-5:23:28 PM

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hal-00555256 , version 1 (12-01-2011)

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Jean-Paul Kleider. Capacitance techniques for the evaluation of electronic properties and defects in disordered thin film semiconductors. 7th International Conference on amorphous and microcrystalline semiconductors, Jun 2010, Saint-Petersburg, Russia. pp.00. ⟨hal-00555256⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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