Radiofrequency dielectric properties of amorphous semiconducting Y-Ba-Cu-O oxide thin films for bolometric detection - CentraleSupélec Access content directly
Conference Papers Year :

Radiofrequency dielectric properties of amorphous semiconducting Y-Ba-Cu-O oxide thin films for bolometric detection

Not file

Dates and versions

hal-00710700 , version 1 (21-06-2012)

Identifiers

  • HAL Id : hal-00710700 , version 1

Cite

Aurélie Gensbittel, Olivier Dubrunfaut, Vishal Jagtap, Alain Kreisler, Annick Dégardin. Radiofrequency dielectric properties of amorphous semiconducting Y-Ba-Cu-O oxide thin films for bolometric detection. E-MRS Spring Meeting, May 2011, Nice, France. ⟨hal-00710700⟩
106 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More