Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique. - CentraleSupélec Access content directly
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Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique.

Olivier Schneegans  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00710701

Submitted on : Thursday, June 21, 2012-3:14:17 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

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hal-00710701 , version 1 (21-06-2012)

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  • HAL Id : hal-00710701 , version 1

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Aurélie Gensbittel, Alireza Banisadr, Olivier Dubrunfaut, Jean-Claude Badot, Alain Kreisler, et al.. Dielectric properties of semiconducting YBaCuO thin films for future uncooled THz bolometers: characterization using a coaxial-discontinuity technique.. PIERS 2011: Progress In Electromagnetics Research Symposium, Mar 2011, Marrakesh, Morocco. ⟨hal-00710701⟩

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