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Conference Papers Year : 2011

Electronic techniques for the characterization of silicon thin films

Christophe Longeaud
Laboratoire de génie électrique de Paris

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00710799

Submitted on : Thursday, June 21, 2012-3:54:47 PM

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hal-00710799 , version 1 (21-06-2012)

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  • HAL Id : hal-00710799 , version 1

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Christophe Longeaud. Electronic techniques for the characterization of silicon thin films. French-russian scientific seminar, Silicon and III-V compound semiconductor thin films for photovoltaics: new trends and perspectives, May 2011, Gif-sur-Yvette, France. ⟨hal-00710799⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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