Wide frequency band dielectric characterization and morphology of low temperature sputtered amorphous Y-Ba-Cu-O thin films; application to infrared detectors - Archive ouverte HAL Access content directly
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Wide frequency band dielectric characterization and morphology of low temperature sputtered amorphous Y-Ba-Cu-O thin films; application to infrared detectors

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Submitted on : Tuesday, January 14, 2014-7:23:56 PM

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hal-00931073 , version 1 (14-01-2014)

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Aurélie Gensbittel, Annick Dégardin, Olivier Dubrunfaut, Vishal Jagtap, Alain Kreisler. Wide frequency band dielectric characterization and morphology of low temperature sputtered amorphous Y-Ba-Cu-O thin films; application to infrared detectors. Conference of the European Materials Science Society (E-MRS 2013), May 2013, Strasbourg, France. ⟨hal-00931073⟩

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