Coplanar conductance measurements and modeling to characterize surface passivation of c-Si wafers by a-Si:H - CentraleSupélec Access content directly
Conference Papers Year : 2013

Coplanar conductance measurements and modeling to characterize surface passivation of c-Si wafers by a-Si:H

Igor P. Sobkowicz
  • Function : Author
Parsathi Chatterjee
  • Function : Author
Marie-Estelle Gueunier-Farret
Laboratoire de génie électrique de Paris
CV
Antoine Salomon
  • Function : Author
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
P. Roca I Cabarrocas
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00931340

Submitted on : Wednesday, January 15, 2014-11:29:55 AM

Last modification on : Friday, March 24, 2023-2:52:58 PM

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hal-00931340 , version 1 (15-01-2014)

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  • HAL Id : hal-00931340 , version 1

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Igor P. Sobkowicz, Parsathi Chatterjee, Marie-Estelle Gueunier-Farret, Antoine Salomon, Jean-Paul Kleider, et al.. Coplanar conductance measurements and modeling to characterize surface passivation of c-Si wafers by a-Si:H. EUPVSEC 2013, Sep 2013, Paris, France. pp.1680 - 1685. ⟨hal-00931340⟩

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