A multiscale model for thin film AMR sensors
Résumé
AMR sensors are among the most widely deployed magnetic field sensors. In contrast to other technologies it has a simple structure and a low production cost. In this paper a multiscale modeling strategy is proposed to describe the performance of these sensors taking their specific features into account. The prediction of the behavior of a typical AMR thin film sensor has been studied and the results are compared to experimental measurements from the literature. The proposed micro-macro model offers an opportunity to investigate optimal material composition, crystallographic texture, film thickness or bias field level for specific applications.