Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield Defects

Hossein Manesh 1, 2 Abelin Kameni 2 Florent Loete 2 Jérôme Genoulaz 3, 4 Lionel Pichon 2 Odile Picon 1
1 ESYCOM - Electronique, Systèmes de communication et Microsystèmes
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
4 Labinal Power Systems
Keywords : modeling Transmission lines soft defects reflectometry
Document type :
Conference papers
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01235557
Contributor : Lionel Pichon <>
Submitted on : Monday, November 30, 2015 - 12:03:48 PM
Last modification on : Friday, October 25, 2019 - 2:34:07 PM

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  • HAL Id : hal-01235557, version 1

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Citation

Hossein Manesh, Abelin Kameni, Florent Loete, Jérôme Genoulaz, Lionel Pichon, et al.. Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield Defects. Joint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, Aug 2015, Dresden, Germany. ⟨hal-01235557⟩

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