Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS) - CentraleSupélec Access content directly
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Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS)

N. Puspitosari
  • Function : Author
S. Gaiaschi
  • Function : Author
C. Longeaud
Laboratoire Génie électrique et électronique de Paris
M. E. Gueunier
CV
E. V. Johnson
CV

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Engineering Sciences [physics]

christophe longeaud  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-01242764

Submitted on : Monday, December 14, 2015-9:23:02 AM

Last modification on : Friday, March 24, 2023-2:53:01 PM

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hal-01242764 , version 1 (14-12-2015)

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  • HAL Id : hal-01242764 , version 1

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N. Puspitosari, S. Gaiaschi, C. Longeaud, M. E. Gueunier, E. V. Johnson. Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS). European Photovoltaïc Solar Energy Conference, Sep 2015, Hambourg, Germany. Proceedings of the European Photovoltaïc Solar Energy Conference. ⟨hal-01242764⟩

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UPMC CNRS CENTRALESUPELEC GEEPS PHEMADIC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES GS-ENGINEERING GS-PHYSIQUE INSTITUT-SCIENCES-LUMIERE
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