Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS) - CentraleSupélec Accéder directement au contenu
Poster De Conférence Année : 2015

Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS)

N. Puspitosari
  • Fonction : Auteur
S. Gaiaschi
  • Fonction : Auteur
M. E. Gueunier
E. V. Johnson
Fichier non déposé

Dates et versions

hal-01242764 , version 1 (14-12-2015)

Identifiants

  • HAL Id : hal-01242764 , version 1

Citer

N. Puspitosari, S. Gaiaschi, C. Longeaud, M. E. Gueunier, E. V. Johnson. Density of states measurements of RF-power, SiF4 and CH4 –tuned-hydrogenated microcrystalline silicon carbon alloy thin films using Fourier transform photocurrent spectroscopy (FTPS). European Photovoltaïc Solar Energy Conference, Sep 2015, Hambourg, Germany. Proceedings of the European Photovoltaïc Solar Energy Conference. ⟨hal-01242764⟩
57 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More