Nanotribology on individual phases of duplex steel: combining roughness, material effects, and friction

Satish Achanta 1, 2 Jean Pierre Celis 1 Pierre Ponthiaux 3 Dirk Drees 2
1 Inst. MTM
2 Falex Tribol N.V.
3 LGPM - Laboratoire de Génie des Procédés et Matériaux - EA 4038
Abstract : In this study, lateral force microscopy (LFM) technique was used to investigate local friction and wear behaviour on individual phases of dual phase steel. Important factors influencing friction interpretation at nanoscale are investigated. A nanoprobe made of silicon nitride (20 nm tip radius) was used for this investigation. The difference in phases is clearly apparent when the surface is smooth but with a slight increase in surface roughness, the frictional difference between the phases got masked. A clear direct dependence of friction force on normal force was observed at nanoscale as predicted by Derjaguin's friction model. This model appeared to be valid irrespective of the surface roughness modifications on different phases of the material. The tip wear phenomenon was detected through adhesion force measurements before and after the test. Even at nanoscales, the wear resistance was found to be directly dependent on the hardness of the phases.
Keywords : dual phase steel lateral force microscopy LFM nanotribology surface roughness Derjaguin's model
Type de document :
Article dans une revue
International Journal of Surface Science and Engineering, 2011, 5 (5/6), pp.331-347. 〈10.1504/IJSURFSE.2011.044392〉
Domaine :
Liste complète des métadonnées
https://hal-centralesupelec.archives-ouvertes.fr/hal-01245650
Contributeur : Catherine Kruch <>
Soumis le : jeudi 17 décembre 2015 - 14:51:23
Dernière modification le : jeudi 5 avril 2018 - 12:30:09

Identifiants

Collections

LGPM | CENTRALESUPELEC | EC-PARIS

Citation

Satish Achanta, Jean Pierre Celis, Pierre Ponthiaux, Dirk Drees. Nanotribology on individual phases of duplex steel: combining roughness, material effects, and friction. International Journal of Surface Science and Engineering, 2011, 5 (5/6), pp.331-347. 〈10.1504/IJSURFSE.2011.044392〉. 〈hal-01245650〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

32

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD