Abstract : Optimization of solar cells device and materials require a set of tools for the control and engineering of traps states which can be introduced during the fabrication process. Deep Level Transient Spectroscopy (DLTS) technique seems to be the most sensitive measuring method to determine electronic properties of deep levels in semiconductors. We use modern device TCAD (Technology Computer Aided Design)
simulation software to evaluate the DLTS technique. The simulated device is a silicon schottky diode.
https://hal-centralesupelec.archives-ouvertes.fr/hal-01253399
Contributeur : Arouna Darga
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Soumis le : dimanche 10 janvier 2016 - 11:27:57
Dernière modification le : jeudi 5 avril 2018 - 12:30:24
