Effective driving voltage on polarization fatigue in (Pb,La)(Zr,Ti)O3 antiferroelectric thin films

Abstract : Polarization fatigue in (Pb0.97La0.02)(Zr0.95Ti0.05)O3(PLZT) antiferroelectric thin films deposited onto silicon wafers is studies by investigating the effect of the peak/average/root-mean-square cycling voltage through varying the waveform of the electrical excitation. Intrestingly, it is found that the fatigue behavior of the film is determined by the root-mean-square voltage of the external driving excitation rather than by the peak or average voltages. Our results can be well explained in the framework of the local phase decomposition model and indicate that the root-mean-square voltage should be considered as the effective driving voltage determining the polarization fatigue PLZT antiferroelectric films.
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Ceramics International, Elsevier, 2015, 41 (Issue 1, Part A), pp.109-114. 〈10.1016/j.ceramint.2014.08.041〉
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Contributeur : Christine Vinée-Jacquin <>
Soumis le : mercredi 27 janvier 2016 - 11:45:03
Dernière modification le : jeudi 5 avril 2018 - 12:30:09

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Wenping Geng, Xiaojie Lou, Xu Jianghong, Fuping Zhang, Liu Yang, et al.. Effective driving voltage on polarization fatigue in (Pb,La)(Zr,Ti)O3 antiferroelectric thin films. Ceramics International, Elsevier, 2015, 41 (Issue 1, Part A), pp.109-114. 〈10.1016/j.ceramint.2014.08.041〉. 〈hal-01262843〉

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