MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES

Abstract : To measure the thermal properties of C/C and C/C-SiC composites constituents, photoreflectance microscopy is used. Specific methods are developed to cope with experimental artefacts (material semi-transparency, convolution effects), so as with fibers and matrix specificities (strong thermal anisotropy, geometric effects ...). Experimental results are presented demonstrating the interest of photoreflectance microscopy for a quantitative determination of the microscopic thermal properties of these complex graphite materials.
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Communication dans un congrès
2001 Review of Progress in Quantitative Non Destructive Evaluation, Jul 2001, Brunswick, United States. Review of QNDE: Proceedings of the "2001 Review of Progress in Quantitative Non Destructive Evaluation" Conference
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Contributeur : Franck Enguehard <>
Soumis le : lundi 14 mars 2016 - 15:04:48
Dernière modification le : mercredi 29 novembre 2017 - 15:28:24

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  • HAL Id : hal-01287490, version 1

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Julien Jumel, Jean-Claude Krapez, F Lepoutre, Franck Enguehard, D Rochais, et al.. MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES. 2001 Review of Progress in Quantitative Non Destructive Evaluation, Jul 2001, Brunswick, United States. Review of QNDE: Proceedings of the "2001 Review of Progress in Quantitative Non Destructive Evaluation" Conference. 〈hal-01287490〉

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