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MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES

Abstract : To measure the thermal properties of C/C and C/C-SiC composites constituents, photoreflectance microscopy is used. Specific methods are developed to cope with experimental artefacts (material semi-transparency, convolution effects), so as with fibers and matrix specificities (strong thermal anisotropy, geometric effects ...). Experimental results are presented demonstrating the interest of photoreflectance microscopy for a quantitative determination of the microscopic thermal properties of these complex graphite materials.
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01287490
Contributor : Franck Enguehard <>
Submitted on : Monday, March 14, 2016 - 3:04:48 PM
Last modification on : Friday, June 26, 2020 - 2:00:04 PM

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Julien Jumel, Jean-Claude Krapez, F Lepoutre, Franck Enguehard, D Rochais, et al.. MICROSCOPIC THERMAL CHARACTERIZATION OF C/C AND C/C-SiC COMPOSITES. 2001 Review of Progress in Quantitative Non Destructive Evaluation, Jul 2001, Brunswick, United States. ⟨hal-01287490⟩

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