Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques

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Submitted on : Tuesday, May 3, 2016 - 11:10:54 AM
Last modification on : Thursday, March 21, 2019 - 1:01:44 PM

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P Eyben, P Bisiaux, A Schulze, A Nazir, W Vandervorst. Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques. Nanotechnology, Institute of Physics, 2015, 26 (35), pp.355702. ⟨10.1088/0957-4484/26/35/355702⟩. ⟨hal-01310822⟩

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