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Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

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hal-01320255 , version 1 (23-05-2016)

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  • HAL Id : hal-01320255 , version 1

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Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩
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