Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode
Aymeric Vecchiola
(1)
,
Pascal Chrétien
(2)
,
Karim Bouzehouane
(1)
,
Olivier Schneegans
(2)
,
Pierre Seneor
(1)
,
Sergio Tatay
(3)
,
Frédéric Houzé
(2)
Aymeric Vecchiola
- Function : Author
- PersonId : 767727
- ORCID : 0000-0003-2801-3762
Pascal Chrétien
- Function : Author
- PersonId : 5981
- IdHAL : pascal-chretien
Olivier Schneegans
- Function : Author
- PersonId : 15895
- IdHAL : olivier-schneegans
- ORCID : 0000-0001-9741-3327
- IdRef : 18007007X
Pierre Seneor
- Function : Author
- PersonId : 184623
- IdHAL : pierre-seneor
- IdRef : 153493399
Frédéric Houzé
- Function : Author
- PersonId : 13067
- IdHAL : frederic-houze
- ORCID : 0000-0001-8054-3184
- IdRef : 15620584X