Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

Aymeric Vecchiola (1) , Pascal Chrétien (2) , Karim Bouzehouane (1) , Olivier Schneegans (2) , Pierre Seneor (1) , Sergio Tatay (3) , Frédéric Houzé (2)

1 UMPhy CNRS/THALES - Unité mixte de physique CNRS/Thales
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 Molecular Science Institute

Domains: Micro and nanotechnologies/Microelectronics

Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩