Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

Aymeric Vecchiola (1) , Pascal Chrétien (2) , Karim Bouzehouane (1) , Olivier Schneegans (2) , Pierre Seneor (1) , Sergio Tatay (3) , Frédéric Houzé (2)

1 Laboratoire Albert Fert (ex-UMPhy Unité mixte de physique CNRS/Thales)
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 Molecular Science Institute

Domaines: Micro et nanotechnologies/Microélectronique

Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩