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Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01320255
Contributor : Frédéric Houzé <>
Submitted on : Monday, May 23, 2016 - 3:48:22 PM
Last modification on : Wednesday, September 16, 2020 - 5:49:00 PM

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  • HAL Id : hal-01320255, version 1

Citation

Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩

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