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Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01320255

Submitted on : Monday, May 23, 2016-3:48:22 PM

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hal-01320255 , version 1 (23-05-2016)

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  • HAL Id : hal-01320255 , version 1

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Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩

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UPMC CNRS CENTRALESUPELEC GEEPS PHEMADIC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES ANR GS-ENGINEERING INSTITUT-SCIENCES-LUMIERE
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