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Conference papers

Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01320255
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Monday, May 23, 2016 - 3:48:22 PM
Last modification on : Monday, April 4, 2022 - 10:40:40 AM

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  • HAL Id : hal-01320255, version 1

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Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩

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