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Conference papers
Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode
Aymeric Vecchiola
1
Pascal Chrétien
2
Karim Bouzehouane
1
Olivier Schneegans
2
Pierre Seneor
1
Sergio Tatay
3
Frédéric Houzé
2
Aymeric Vecchiola 1
Author
Pascal Chrétien 2
Author IdHAL : pascal-chretien
Karim Bouzehouane 1
Author
Olivier Schneegans 2
Author IdHAL : olivier-schneegans ORCID : https://orcid.org/0000-0001-9741-3327
Pierre Seneor 1
Author IdHAL : pierre-seneor
Sergio Tatay 3
Author
Frédéric Houzé 2
Author IdHAL : frederic-houze
1
UMPhy CNRS/THALES - Unité mixte de physique CNRS/Thales ( 1 avenue Augustin Fresnel, 91767 Palaiseau Cedex, France - France)
- CNRS - Centre National de la Recherche Scientifique : UMR137 (France)
- THALES [France] (France)
2
GeePs - Laboratoire Génie électrique et électronique de Paris (11, rue Joliot Curie
Plateau de Moulon
91192 Gif sur Yvette - France)
- CNRS - Centre National de la Recherche Scientifique : UMR8507 (France)
- CentraleSupélec (3, rue Joliot Curie, Plateau de Moulon, 91192 GIF-SUR-YVETTE Cedex - France)
- UPMC - Université Pierre et Marie Curie - Paris 6 (4 place Jussieu - 75005 Paris - France)
- UP11 - Université Paris-Sud - Paris 11 (Bâtiment 300 - 91405 Orsay cedex - France)
3
Molecular Science Institute (P.O. Box 22085, ES-46071 Valencia - Spain)
- University of Valencia (France)
Document type :
Conference papers
Complete list of metadata
https://hal-centralesupelec.archives-ouvertes.fr/hal-01320255
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Monday, May 23, 2016 - 3:48:22 PM
Last modification on : Monday, April 4, 2022 - 10:40:40 AM
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Monday, May 23, 2016 - 3:48:22 PM
Last modification on : Monday, April 4, 2022 - 10:40:40 AM
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- HAL Id : hal-01320255, version 1
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Citation
Aymeric Vecchiola, Pascal Chrétien, Karim Bouzehouane, Olivier Schneegans, Pierre Seneor, et al.. Local resistance imaging on soft materials by conducting probe atomic force microscopy in intermittent contact mode. NanoMetrology 2016, Jun 2016, Paris, France. pp.126. ⟨hal-01320255⟩
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