Electrical and structural mapping of friction induced defects in graphene layers

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01332589
Contributor : Frédéric Houzé <>
Submitted on : Thursday, June 16, 2016 - 11:20:20 AM
Last modification on : Thursday, March 21, 2019 - 2:41:35 PM

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  • HAL Id : hal-01332589, version 1

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Pascal Chrétien, Sophie Noël, Alexandre Jaffré, Frédéric Houzé, David Brunel, et al.. Electrical and structural mapping of friction induced defects in graphene layers. 62nd IEEE Holm Conference on Electrical Contacts, Oct 2016, Clearwater Beach, United States. pp.72-79. ⟨hal-01332589⟩

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