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Resistive switching behavior in LixCoO2-based devices fabricated on Si

Orfanidou C.M. 1 C N Mihailescu 1 van Huy Mai 2 van Son Nguyen 2 Olivier Schneegans 2 G. Stan 3 John Giapintzakis 1 
1 University of Cyprus [Nicosia]
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 NIMP - National Institute of Materials Physics
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Conference papers
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01441139
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Thursday, January 19, 2017 - 4:06:42 PM
Last modification on : Sunday, June 26, 2022 - 5:21:59 AM

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  • HAL Id : hal-01441139, version 1

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UPMC | CNRS | CENTRALESUPELEC | GEEPS | PHEMADIC | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | SU-SCIENCES | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE

Citation

Orfanidou C.M., C N Mihailescu, van Huy Mai, van Son Nguyen, Olivier Schneegans, et al.. Resistive switching behavior in LixCoO2-based devices fabricated on Si. E-MRS, Sep 2016, Varsovie, Poland. ⟨hal-01441139⟩

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