Statistical Analysis of Current-based Features for Dip Voltage Fault Detection and Isolation

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01578478
Contributor : Claude Delpha <>
Submitted on : Tuesday, August 29, 2017 - 11:49:12 AM
Last modification on : Thursday, March 21, 2019 - 2:44:03 PM

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Amel Adouni, Dhia Chariag, Claude Delpha, Demba Diallo, Lassaad Sbita. Statistical Analysis of Current-based Features for Dip Voltage Fault Detection and Isolation. 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017), Oct 2017, Beijing, China. ⟨hal-01578478⟩

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