Characterization of GaP/Si heterojunctions by space charge capacitance measurements

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01632942
Contributor : Jean-Paul Kleider <>
Submitted on : Friday, November 10, 2017 - 5:46:40 PM
Last modification on : Monday, January 13, 2020 - 3:12:12 PM

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  • HAL Id : hal-01632942, version 1

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Artem Baranov, Alexander S. Gudovskikh, I.A. Morozov, A. Mozharov, Ekaterina V. Nikitina, et al.. Characterization of GaP/Si heterojunctions by space charge capacitance measurements. E-MRS 2017 Spring Meeting, May 2017, Strasbourg, France. ⟨hal-01632942⟩

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