Numerical analysis of kelvin probe force microscopy

J.P. Connolly; J Alvarez; Marie-Estelle Gueunier-Farret; Jean-Paul Kleider; Clément Marchat; Denis Mencaraglia; Yong Huang; Alain Rolland

Numerical analysis of kelvin probe force microscopy

J.P. Connolly ^{1, 2} J Alvarez ² Marie-Estelle Gueunier-Farret ² Jean-Paul Kleider ² Clément Marchat ^{1, 2} Denis Mencaraglia ² Yong Huang ³ Alain Rolland ³

1 IPVF - Institut Photovoltaïque d’Ile-de-France

2 GeePs - Laboratoire Génie électrique et électronique de Paris

3 Institut FOTON - Institut des Fonctions Optiques pour les Technologies de l'informatiON

Document type :

Poster communications

Domain :

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Engineering Sciences [physics] / Electric power

Engineering Sciences [physics] / Optics / Photonic

Engineering Sciences [physics] / Materials

Complete list of metadatas

https://hal-centralesupelec.archives-ouvertes.fr/hal-01633187
Contributor : Jean-Paul Kleider <>
Submitted on : Saturday, November 11, 2017 - 5:47:07 PM
Last modification on : Thursday, March 21, 2019 - 2:39:43 PM

Numerical analysis of kelvin probe force microscopy

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Numerical analysis of kelvin probe force microscopy

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