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Numerical analysis of kelvin probe force microscopy

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Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci] Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics Engineering Sciences [physics] Electric power Engineering Sciences [physics] Optics / Photonic Engineering Sciences [physics] Materials

Jean-Paul KLEIDER  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-01633187

Submitted on : Saturday, November 11, 2017-5:47:07 PM

Last modification on : Friday, August 5, 2022-2:54:52 PM

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hal-01633187 , version 1 (11-11-2017)

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  • HAL Id : hal-01633187 , version 1

Cite

J.P. Connolly, J Alvarez, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Clément Marchat, et al.. Numerical analysis of kelvin probe force microscopy. 7è Journées Nationales du PhotoVoltaïque (JNPV 2017), Dec 2017, Dourdan, France. ⟨hal-01633187⟩

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