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Threshold Analysis of Semiconductor Lasers: Novel Parameter Extraction Method

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01702781
Contributor : Zeno Toffano <>
Submitted on : Wednesday, February 7, 2018 - 11:10:25 AM
Last modification on : Wednesday, September 16, 2020 - 4:47:32 PM

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Zeno Toffano, Alain Destrez, S. Bozorgui. Threshold Analysis of Semiconductor Lasers: Novel Parameter Extraction Method. Proceedings of European Meeting on Lasers and Electro-Optics, Sep 1996, Hamburg, France. ⟨10.1109/CLEOE.1996.562447⟩. ⟨hal-01702781⟩

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