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Dynamic Risk Assessment Based on Statistical Failure Data and Condition-Monitoring Degradation Data

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01786588
Contributor : Zhiguo Zeng <>
Submitted on : Saturday, May 5, 2018 - 10:46:25 PM
Last modification on : Wednesday, July 15, 2020 - 10:36:12 AM

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Zhiguo Zeng, Enrico Zio. Dynamic Risk Assessment Based on Statistical Failure Data and Condition-Monitoring Degradation Data. IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, In press, pp.1 - 14. ⟨10.1109/TR.2017.2778804⟩. ⟨hal-01786588⟩

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